Poster · Sydney
PEEK: One-Step Look-Ahead Exposure Bias Correction for Diffusion Sampling
- When
- Wed 9 Dec 2026, 10:00–13:00 AEDT
- Where
- Hall 1-4, ICC Sydney
Exhibition Centre, Level 1 - Session
- Sydney Poster Session 3
- Authors
- Yunwei Bai, Ying Kiat Tan, Tsuhan Chen
- Organisations
- National University of Singapore
- QRS classification
- Generative models, Computer vision