Poster · Paris

Parameterized Complexity of Stationarity Testing for Piecewise-Affine Functions and Shallow CNN Losses

Name: Parameterized Complexity of Stationarity Testing for Piecewise-Affine Functions and Shallow CNN Losses
Start: 2026-12-09T12:30:00+01:00
End: 2026-12-09T14:30:00+01:00
Location: Paris Poster Hall, Paris

When: Wed 9 Dec 2026, 12:30–14:30 CET
Where: Paris Poster Hall
Session: Paris Poster Session 1
Authors: Yuhan Ye
Organisations: Massachusetts Institute of Technology

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